The IBEX-WAT system operates with single or multi-channel configurations and is designed for Statistical Process Control (SPC) of the production yield at Wafer Acceptance Test (WAT), thanks to Process Control and Monitoring (PCM) of test structures.
The system is using Hprobes exclusive technology of the magnetic field generator integrated into the test head, which is mounted on the wafer prober.
IBEX is using Hprobes turnkey proprietary software (Hmap®) with GUI to manually operate in R&D, or in fully automated wafer production fabs. The software includes optimized production test programs dedicated to parametric testing of MRAM devices.
The tester is driven by high-end instrumentation, which has been selected to achieve extremely fast testing times for characterizing MRAM magnetic tunnel junction or bit-cell. This instrumentation includes brands such as Keysight, Tektronix and NI, and are integrated using Hprobes proprietary building blocks.
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