Magnetic Sensor Test Equipment

The LINX-WS tester is dedicated to magnetic sensor chip sorting at wafer level.

LINX-WS is using Hprobe’s proprietary technology of the magnetic field generator, integrated with a 3-axis robotized test head. It can operate with manually or automatically loaded probe cards.

The field generation is driven by high performance instrumentation to achieve stable static or high sweep rate variable fields.

It is using Hprobe’s turnkey proprietary software (Hmap®) with GUI for field pattern generation and calibration in single or multi-channel configurations and includes optimized field generation patterns available in static or dynamic modes. The system has programmable features to enable integration with the user’s test platform.

This instrumentation includes brands such as Keysight, Tektronix and NI, and are integrated using Hprobe’s proprietary building blocks.